| 1 |
30640426 | Trap-Assisted Enhanced Bias Illumination Stability of Oxide Thin Film Transistor by Praseodymium Doping. | 2019 Feb 6 |
1 |
| 2 |
29998730 | Visible Light-Erasable Oxide FET-Based Nonvolatile Memory Operated with a Deep Trap Interface. | 2018 Aug 8 |
2 |
| 3 |
27483908 | Extraction of Distance Between Interface Trap and Oxide Trap from Random Telegraph Noise in Gate-Induced Drain Leakage. | 2016 May |
2 |
| 4 |
27758108 | Temperature Dependent Border Trap Response Produced by a Defective Interfacial Oxide Layer in Al2O3/InGaAs Gate Stacks. | 2016 Nov 9 |
3 |