Title : Dielectric Properties of Ultrathin CaF2 Ionic Crystals.

Pub. Date : 2020 Aug

PMID : 32666564






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1 By applying >3000 ramped voltage stresses and several current maps at different locations of the samples via conductive atomic force microscopy, it is statistically demonstrated that ultrathin CaF2 shows much better dielectric performance (i.e., homogeneity, leakage current, and dielectric strength) than SiO2 , TiO2 , and h-BN. boron nitride CCR4-NOT transcription complex subunit 8 Homo sapiens